Semiconductor test probe SDP038-BB-60-G

Semi-conductortest probe SDP038-BB-60-G

Pitch 0.55mm

MechanicalSpecification

Full Stroke: 1.00mm

Rated Stroke: 0.60mm

Spring Force:25gf@ Load 0.60mm

ElectricalSpecification

Current Rating: 0.5 A, Continuous

Bandwidth:4.2GHz@-1dB

Propagation Delay:27ps

Materials

Barrel:PhosphorBronze, Gold Plated.

Plunger:Full-HardBeryllium Copper. Gold Plated.

Spring: MusicWire,Gold Plated.

Test probes works as electrical interfaces between thetest equipment and the circuit board under test. Semi-conductor probes aremainly used for testing frequency of communications devices such as mobilephones, interphones, computers, etc.

The construction of SDP038-BB-60-G:

The plunger is made of full-hard beryllium copper, platedwith gold to eliminate surface oxides and to lower electrical resistance

Various probe tip styles are adopted to suit any testrequirement according to different applications.

Spring is constructed of music wire, plated with goldwhich prevents corrosion.

The barrel is made of phosphor bronze, plated withgold.

HOW TO eliminate contact problems caused by dirtyprobes

Preventive Maintenance:  

Environment – reduce airborne contamination such asdust, clothing fibers or particles from an adjacent wave-solder machine 

PCB –keep printed circuit boards as clean as possible

Dust Covers – put dust covers over idle fixtures

Air Filters –fixing an air filter in the releaseport 

Probe Cleaning: 

Gently brushing the probe tips with a small brush withnylon or natural fiber bristles

In addition to semiconductortest probe SDP038-BB-60-G, our factory also produces other models of highquality test pins at competitive prices. If you are interested, please feelfree to browse our website ()or contact me any time. Thank you!

Contact person:Stella

Tel:86-755-27494785-229

Email: probe321@163.com

Skype:test123probe